Special Flexible Probe Tips Allow Absorbing Probe Arm Thermal Drift Movement

August 2013

Janis Research developed a new technique of cryogenic probe station special flexible probe tips that allows absorbing the probe arm thermal drift movement during variable DUT temperature measurements. The result is a stable probe tip position during probe station temperature cycling. As an example, the ST-500 probe station DUT resistance versus temperature measurements during the continuous temperature ramp from room temperature to 4.2 K is shown below.

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Shown is the Janis Research model ST-500 probe station DUT resistance versus temperature measurements during the continuous temperature ramp from room temperature to 4.2 K.

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